ion focusing

См. также в других словарях:

• Ion optics — involves the focusing of plasmas and ion streams, usually in mass spectrometry.Electric field manipulation* Electrostatic lens ** Einzel lens * Electrostatic analyzerMagnetic field manipulation* Quadrupole deflectoree also* Mass to charge ratio * …   Wikipedia

• Ion Creangă — Creangă redirects here. For other uses, see Creangă (surname). Ion Creangă Nică al lui Ştefan a Petrei Ion Torcălău Ioan Ştefănescu Born 1837 or 1839 Târgu Neamţ Died …   Wikipedia

• Ion Negoiţescu — Born August 10, 1921(1921 08 10) Cluj Died February 6, 1993(1993 02 06) (aged 71) Munich Pen name …   Wikipedia

• Ion beam — An ion beam is a type of particle beam consisting of ions. Ion beams have many uses in electronics manufacturing (principally ion implantation) and other industries. Today s ion beam sources are typically derived from the mercury vapor thrusters… …   Wikipedia

• Ion Storm Inc. — Infobox Company company name = Ion Storm Inc. company company type = Defunct foundation = November 15, 1996 location city = Dallas, Texas location country = United States key people = John Romero, Tom Hall, Jerry O Flaherty, Todd Porter, Warren… …   Wikipedia

• ION Media Networks — Infobox Company company name = ION Media Networks company company type = Public (OTC: IION.PK) foundation = West Palm Beach, Florida (1991) location = West Palm Beach, Florida key people = R. Brandon Burgess num employees = 433 (2005) industry =… …   Wikipedia

• Secondary ion mass spectrometry — Infobox chemical analysis name = Secondary ion mass spectrometry caption =CAMECA IMS3f Magnetic SIMS Instrument acronym = SIMS classification =Mass spectrometry analytes = Solid surfaces, thin films related = Fast atom bombardment… …   Wikipedia

• Quadrupole ion trap — Scheme of a Quadrupole ion trap of classical setup with a particle of positive charge (dark red), surrounded by a cloud of similarly charged particles (light red). The electric field E (blue) is generated by a quadrupole of endcaps (a, positive)… …   Wikipedia

• Low-energy ion scattering — LEIS redirects here; for the Hawaiian garland see Lei (Hawaii). Low energy ion scattering spectroscopy (LEIS), sometimes referred to simply as ion scattering spectroscopy (ISS), is a surface sensitive analytical technique used to characterize the …   Wikipedia

• Plasma-immersion ion implantation — (PIII) [cite book | title = Materials Science of Thin Films | author = Milton Ohring | publisher = Academic Press | year = 2002 | isbn = 0125249756 | url = http://books.google.com/books?id=SOt yFjV xwC pg=PA267… …   Wikipedia

• Sensitive high resolution ion microprobe — The sensitive high resolution ion microprobe (SHRIMP) is a large diameter, double focusing secondary ion mass spectrometer (SIMS). The SHRIMP is primarily used for geological and geochemical applications. It can rapidly measure the isotopic and… …   Wikipedia